Johan Swerts

Publication Activity (10 Years)

Years Active: 2015-2019
Publications (10 Years): 5

Top Topics

Signal Processor

Design Considerations

Top Venues

Publications

Kevin Garello, Farrukh Yasin, H. Hody, S. Couet, Laurent Souriau, Shamin H. Sharifi, Johan Swerts, Robert Carpenter, S. Rao, Wonsub Kim, J. Wu, K. K. V. Sethu, M. Pak, N. Jossart, D. Crotti, Arnaud Furnémont, Gouri Sankar Kar
Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM. VLSI Circuits (2019)
Barry J. O'Sullivan, Simon Van Beek, Philippe J. Roussel, S. Rao, Wonsub Kim, S. Couet, Johan Swerts, Farrukh Yasin, Dimitri Crotti, Dimitri Linten, Gouri Sankar Kar
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. IRPS (2018)
Kevin Garello, Kevin Garello Yasin, S. Couet, Laurent Souriau, Johan Swerts, S. Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, Kris Croes, N. Jossart, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Fumemont, Pietro Gambardella, Gouri Sankar Kar
SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories. VLSI Circuits (2018)
Kevin Garello, Farrukh Yasin, S. Couet, Laurent Souriau, Johan Swerts, S. Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, N. Jossart, Kris Croes, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Furnémont, Pietro Gambardella, Gouri Sankar Kar
SOT-MRAM 300mm integration for low power and ultrafast embedded memories. CoRR (2018)
Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken
Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS (2015)