Farrukh Yasin

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 9

Top Topics

Design Considerations

Top Venues

Publications

W. Kim, V. Pica, N. Jossart, Farrukh Yasin, Kurt Wostyn, S. Couet, Sidharth Rao
A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays. IMW (2024)
Siddharth Rao, Kaiming Cai, Giacomo Talmelli, Nathali Franchina-Vergel, Ward Janssens, Hubert Hody, Farrukh Yasin, Kurt Wostyn, Sebastien Couet
Spin-orbit torque MRAM for ultrafast cache and neuromorphic computing applications. IMW (2023)
Sidharth Rao, Woojin Kim, Simon Van Beek, Shreya Kundu, Manu Perumkunnil, Stefan Cosemans, Farrukh Yasin, Sebastien Couet, Robert Carpenter, Barry J. O'Sullivan, Shamin H. Sharifi, N. Jossart, Laurent Souriau, Ludovic Goux, Dimitri Crotti, Gouri Sankar Kar
STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. IMW (2021)
Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. IRPS (2021)
Trong Huynh Bao, Anabela Veloso, Sushil Sakhare, Philippe Matagne, Julien Ryckaert, Manu Perumkunnil, Davide Crotti, Farrukh Yasin, Alessio Spessot, Arnaud Furnémont, Gouri Sankar Kar, Anda Mocuta
Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications. DAC (2019)
Kevin Garello, Farrukh Yasin, H. Hody, S. Couet, Laurent Souriau, Shamin H. Sharifi, Johan Swerts, Robert Carpenter, S. Rao, Wonsub Kim, J. Wu, K. K. V. Sethu, M. Pak, N. Jossart, D. Crotti, Arnaud Furnémont, Gouri Sankar Kar
Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM. VLSI Circuits (2019)
Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS (2019)
Barry J. O'Sullivan, Simon Van Beek, Philippe J. Roussel, S. Rao, Wonsub Kim, S. Couet, Johan Swerts, Farrukh Yasin, Dimitri Crotti, Dimitri Linten, Gouri Sankar Kar
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. IRPS (2018)
Kevin Garello, Farrukh Yasin, S. Couet, Laurent Souriau, Johan Swerts, S. Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, N. Jossart, Kris Croes, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Furnémont, Pietro Gambardella, Gouri Sankar Kar
SOT-MRAM 300mm integration for low power and ultrafast embedded memories. CoRR (2018)