Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown.
Barry J. O'SullivanSimon Van BeekPhilippe J. RousselS. RaoWonsub KimS. CouetJohan SwertsFarrukh YasinDimitri CrottiDimitri LintenGouri Sankar KarPublished in: IRPS (2018)