Simon Van Beek

Publication Activity (10 Years)

Years Active: 2015-2023
Publications (10 Years): 13

Top Topics

Design Considerations

Top Venues

Publications

Fernando García-Redondo, S. Rao, M. Gupta, Manu Perumkunnil, Y. Xiang, D. Abdi, Simon Van Beek, S. Couet, Marie Garcia Bardon
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes. ESSDERC (2023)
Simon Van Beek, Kaiming Cai, Kaiquan Fan, Giacomo Talmelli, Anna Trovato, Nico Jossart, Siddharth Rao, Adrian Vaisman Chasin, Sebastien Couet
MTJ degradation in multi-pillar SOT-MRAM with selective writing. IRPS (2023)
Kaiming Cai, Simon Van Beek, Siddharth Rao, K. Fan, M. Gupta, V. D. Nguyen, Ganesh Jayakumar, G. Talmelli, S. Couet, Gouri Sankar Kar
Selective operations of multi-pillar SOT-MRAM for high density and low power embedded memories. VLSI Technology and Circuits (2022)
Simon Van Beek, Kaiming Cai, Siddharth Rao, Ganesh Jayakumar, Sebastien Couet, Nico Jossart, Adrian Chasin, Gouri Sankar Kar
MTJ degradation in SOT-MRAM by self-heating-induced diffusion. IRPS (2022)
Sidharth Rao, Woojin Kim, Simon Van Beek, Shreya Kundu, Manu Perumkunnil, Stefan Cosemans, Farrukh Yasin, Sebastien Couet, Robert Carpenter, Barry J. O'Sullivan, Shamin H. Sharifi, N. Jossart, Laurent Souriau, Ludovic Goux, Dimitri Crotti, Gouri Sankar Kar
STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. IMW (2021)
Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. IRPS (2021)
Simon Van Beek, Barry J. O'Sullivan, Sebastien Couet, Davide Crotti, Dimitri Linten, Gouri Sankar Kar
Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs. IRPS (2020)
Erik Bury, Adrian Chasin, Michiel Vandemaele, Simon Van Beek, Jacopo Franco, Ben Kaczer, Dimitri Linten
} bias space. IRPS (2019)
Barry J. O'Sullivan, Simon Van Beek, Philippe J. Roussel, S. Rao, Wonsub Kim, S. Couet, Johan Swerts, Farrukh Yasin, Dimitri Crotti, Dimitri Linten, Gouri Sankar Kar
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown. IRPS (2018)
Simon Van Beek, Philippe Roussel, Barry J. O'Sullivan, Robin Degraeve, Stefan Cosemans, Dimitri Linten, Gouri Sankar Kar
Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. ESSDERC (2018)
Erik Bury, Ben Kaczer, Simon Van Beek, Dimitri Lintern
Experimental extraction of BEOL composite equivalent thermal conductivities for application in self-heating simulations. ESSDERC (2018)
Kevin Garello, Kevin Garello Yasin, S. Couet, Laurent Souriau, Johan Swerts, S. Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, Kris Croes, N. Jossart, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Fumemont, Pietro Gambardella, Gouri Sankar Kar
SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories. VLSI Circuits (2018)
Kevin Garello, Farrukh Yasin, S. Couet, Laurent Souriau, Johan Swerts, S. Rao, Simon Van Beek, Wonsub Kim, Enlong Liu, Shreya Kundu, Diana Tsvetanova, N. Jossart, Kris Croes, E. Grimaldi, M. Baumgartner, D. Crotti, Arnaud Furnémont, Pietro Gambardella, Gouri Sankar Kar
SOT-MRAM 300mm integration for low power and ultrafast embedded memories. CoRR (2018)
Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken
Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS (2015)