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Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit.

Simon Van BeekPhilippe RousselBarry J. O'SullivanRobin DegraeveStefan CosemansDimitri LintenGouri Sankar Kar
Published in: ESSDERC (2018)
Keyphrases
  • maximum likelihood
  • information technology
  • steady state
  • real time
  • simulation study
  • data mining
  • e learning
  • expectation maximization
  • theoretical framework