Shamin H. Sharifi

Publication Activity (10 Years)

Years Active: 2019-2022
Publications (10 Years): 7

Top Topics

Image Segmentation

Semiconductor Devices

Control Problems

Top Venues

VLSI Technology and Circuits

Publications

S. Subhechha, Nouredine Rassoul, Attilio Belmonte, H. Hody, Harold Dekkers, Michiel J. van Setten, Adrian Chasin, Shamin H. Sharifi, K. Banerjee, H. Puliyalil, S. Kundu, M. Pak, D. Tsvetanova, N. Bazzazian, Kevin Vandersmissen, D. Batuk, J. Geypen, J. Heijlen, Romain Delhougne, Gouri Sankar Kar
Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control. ICICDT (2022)
S. Subhechha, Nouredine Rassoul, Attilio Belmonte, H. Hody, Harold Dekkers, Michiel J. van Setten, Adrian Chasin, Shamin H. Sharifi, S. Sutar, L. Magnarin, Umberto Celano, H. Puliyalil, S. Kundu, M. Pak, Lieve Teugels, D. Tsvetanova, N. Bazzazian, Kevin Vandersmissen, C. Biasotto, D. Batuk, J. Geypen, J. Heijlen, Romain Delhougne, Gouri Sankar Kar
Ultra-low Leakage IGZO-TFTs with Raised Source/Drain for Vt > 0 V and Ion > 30 µA/µm. VLSI Technology and Circuits (2022)
Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin H. Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar
Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors. IRPS (2022)
Taras Ravsher, Shamin H. Sharifi, Andrea Fantini, Hubert Hody, Thomas Witters, Daniele Garbin, Robin Degraeve, Valeri Afanas'ev, Jan Van Houdt, Ludovic Goux, D. Crotti, Gouri Sankar Kar
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability. IMW (2021)
Sidharth Rao, Woojin Kim, Simon Van Beek, Shreya Kundu, Manu Perumkunnil, Stefan Cosemans, Farrukh Yasin, Sebastien Couet, Robert Carpenter, Barry J. O'Sullivan, Shamin H. Sharifi, N. Jossart, Laurent Souriau, Ludovic Goux, Dimitri Crotti, Gouri Sankar Kar
STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application. IMW (2021)
Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. IRPS (2021)
Kevin Garello, Farrukh Yasin, H. Hody, S. Couet, Laurent Souriau, Shamin H. Sharifi, Johan Swerts, Robert Carpenter, S. Rao, Wonsub Kim, J. Wu, K. K. V. Sethu, M. Pak, N. Jossart, D. Crotti, Arnaud Furnémont, Gouri Sankar Kar
Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM. VLSI Circuits (2019)