Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability.

Taras Ravsher Shamin H. Sharifi Andrea Fantini Hubert Hody Thomas Witters Daniele Garbin Robin Degraeve Valeri Afanas'ev Jan Van Houdt Ludovic Goux D. Crotti Gouri Sankar Kar

Published in: IMW (2021)

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