Hubert Hody

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 5

Top Topics

Reliability Assessment

Semiconductor Devices

Top Venues

VLSI Technology and Circuits

Publications

Taras Ravsher, Robin Degraeve, Daniele Garbin, Sergiu Clima, Andrea Fantini, Gabriele Luca Donadio, Shreya Kundu, Wouter Devulder, Hubert Hody, Goedele Potoms, Jan Van Houdt, Valeri Afanas'ev, Attilio Belmonte, Gouri Sankar Kar
Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory. IRPS (2024)
Siddharth Rao, Kaiming Cai, Giacomo Talmelli, Nathali Franchina-Vergel, Ward Janssens, Hubert Hody, Farrukh Yasin, Kurt Wostyn, Sebastien Couet
Spin-orbit torque MRAM for ultrafast cache and neuromorphic computing applications. IMW (2023)
Taras Ravsher, Daniele Garbin, Andrea Fantini, Robin Degraeve, Sergiu Clima, Gabriele Luca Donadio, Shreya Kundu, Hubert Hody, Wouter Devulder, Jan Van Houdt, Valeri Afanas'ev, Romain Delhougne, Gouri Sankar Kar
Enhanced performance and low-power capability of SiGeAsSe-GeSbTe 1S1R phase-change memory operated in bipolar mode. VLSI Technology and Circuits (2022)
Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin H. Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar
Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors. IRPS (2022)
Taras Ravsher, Shamin H. Sharifi, Andrea Fantini, Hubert Hody, Thomas Witters, Daniele Garbin, Robin Degraeve, Valeri Afanas'ev, Jan Van Houdt, Ludovic Goux, D. Crotti, Gouri Sankar Kar
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability. IMW (2021)