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Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution.

Simon Van BeekSiddharth RaoShreya KunduWoojin KimBarry J. O'SullivanStefan CosemansFarrukh YasinRobert CarpenterSebastien CouetShamin H. SharifiNico JossartDavide CrottiGouri Sankar Kar
Published in: IRPS (2021)
Keyphrases
  • software engineering
  • artificial intelligence
  • edge detection
  • mathematical model
  • neural network
  • linear equations
  • database
  • image segmentation
  • optimal solution
  • optimization method
  • reliability analysis