Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions.
Simon Van BeekKoen MartensPhilippe RousselGabriele Luca DonadioJohan SwertsSofie MertensGouri Sankar KarTai MinGuido GroesenekenPublished in: IRPS (2015)
Keyphrases
- high accuracy
- preprocessing
- cost function
- mathematical model
- synthetic data
- detection method
- classification accuracy
- high precision
- clustering method
- computational cost
- experimental evaluation
- pairwise
- data sets
- edge detection
- feature set
- computationally efficient
- computational complexity
- objective function
- power system
- similarity measure
- clustering algorithm