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Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks.
Andrea Vici
Robin Degraeve
João Pedro Bastos
Philippe Roussel
Ingrid De Wolf
Published in:
IRPS (2022)
Keyphrases
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low voltage
power line
design considerations
pattern recognition
power management
digital images
object oriented
image restoration
energy consumption
cmos technology