On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking.
Jouke VerbreeErik Jan MarinissenPhilippe RousselDimitrios VelenisPublished in: ETS (2010)
Keyphrases
- semiconductor manufacturing
- cost effectiveness
- integrated circuit
- cost effective
- process control
- matching algorithm
- low cost
- massively parallel
- digital libraries
- matching process
- production system
- source code
- graph matching
- keypoints
- learning objects
- e learning
- stereo matching
- feature points
- high speed
- programmable logic