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Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.

Alexander MakarovDimitri LintenStanislav TyaginovBen KaczerPhilippe RousselAdrian ChasinMichiel VandemaeleGeert HellingsAl-Moatasem El-SayedMarkus JechTibor Grasser
Published in: ESSDERC (2019)
Keyphrases
  • databases
  • relational databases
  • information retrieval
  • computer vision
  • information systems
  • knowledge base
  • three dimensional
  • feature extraction
  • data streams
  • special case