Y.-L. Li

Publication Activity (10 Years)

Years Active: 2004-2005
Publications (10 Years): 0

Publications

Y.-L. Li, Zsolt Tokei, Philippe Roussel, Guido Groeseneken, Karen Maex
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectron. Reliab. 45 (9-11) (2005)
Zsolt Tokei, Y.-L. Li, G. P. Beyer
Reliability challenges for copper low-k dielectrics and copper diffusion barriers. Microelectron. Reliab. 45 (9-11) (2005)
Nicholas J. Belkin, Michael J. Cole, Jacek Gwizdka, Y.-L. Li, J.-J. Liu, Gheorghe Muresan, C. A. Smith, A. Taylor, Xiaojun Yuan, Dmitri Roussinov
Rutgers Information Interaction Lab at TREC 2005: Trying HARD. TREC (2005)
Nicholas J. Belkin, I. Chaleva, Michael J. Cole, Y.-L. Li, Lu Liu, Ying-Hsang Liu, Gheorghe Muresan, Catherine L. Smith, Ying Sun, Xiaojun Yuan, Xiao-Min Zhang
Rutgers' HARD Track Experiences at TREC 2004. TREC (2004)