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G. P. Beyer
Publication Activity (10 Years)
Years Active: 2005-2005
Publications (10 Years): 0
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Publications
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Zsolt Tokei
,
Y.-L. Li
,
G. P. Beyer
Reliability challenges for copper low-k dielectrics and copper diffusion barriers.
Microelectron. Reliab.
45 (9-11) (2005)