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Transient voltage overshoot in TLP testing - Real or artifact?

David TrémouillesSteven ThijsPhilippe RousselM. I. NatarajanVesselin K. VassilevGuido Groeseneken
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • steady state
  • database
  • power system
  • neural network
  • real life
  • software testing
  • real world
  • artificial intelligence
  • search engine
  • input output
  • test data
  • control strategy