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Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects.

Lucas A. TambaraFelipe AlmeidaPaolo RechFernanda Lima KastensmidtGiovanni BruniChristopher Frost
Published in: ARC (2015)
Keyphrases
  • databases
  • fine grain
  • coarse grain
  • parallel computation
  • reconfigurable hardware
  • distributed memory
  • multiresolution
  • data management
  • nested transactions
  • field programmable gate array
  • real time
  • fine grained