Robert C. Baumann

Publication Activity (10 Years)

Years Active: 2001-2024
Publications (10 Years): 3

Top Topics

Safety Critical

Computing Devices

Top Venues

DSN (Supplements)

Publications

Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS (2024)
Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech
Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications. ETS (2020)
Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech
An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. DSN (Supplements) (2020)
Robert C. Baumann, Eric B. Smith
B fission as a major source of soft errors in high density SRAMs. Microelectron. Reliab. 41 (2) (2001)