Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation.
Rodolfo A. Rodriguez-DavilaL. Fernandez-IzquierdoJ. FinkT. MoiseRobert C. BaumannB. GnadeManuel Quevedo-LopezChadwin D. YoungPublished in: IRPS (2024)
Keyphrases
- thin film
- reliability assessment
- x ray
- high density
- electron beam
- medical imaging
- electron microscopy
- digital x ray images
- power system
- x ray images
- ct scans
- low density
- integrated circuit
- three dimensional
- short circuit
- intraoperative
- data center
- metal oxide
- transmission electron microscopy
- small animal
- solar cell
- power consumption
- projection images
- pre operative
- data mining
- tomographic images
- low power
- medical images
- cone beam ct
- cone beam
- low cost
- guide wire