Chadwin D. Young

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 6

Top Topics

Electron Microscopy

Voltage Stability

Top Venues

IEEE Trans. Reliab.

Microelectron. Reliab.

Publications

Rodolfo A. Rodriguez-Davila, L. Fernandez-Izquierdo, J. Fink, T. Moise, Robert C. Baumann, B. Gnade, Manuel Quevedo-Lopez, Chadwin D. Young
Reliability Assessment of a-IGZO and ZnO Thin Film Transistors (TFTs) to X-ray irradiation. IRPS (2024)
Rodolfo A. Rodriguez-Davila, Richard A. Chapman, Massimo Catalano, Manuel Quevedo-Lopez, Chadwin D. Young
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3. IRPS (2020)
Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young
Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric. IRPS (2019)
Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace
Electrical characterization of process induced effects on non-silicon devices. ICICDT (2018)
Patrick Ponath, Agham B. Posadas, Yuan Ren, Xiaoyu Wu, Keji Lai, Alex Demkov, Michael Schmidt, Ray Duffy, Paul K. Hurley, Jian Wang, Chadwin D. Young, Rama K. Vasudevan, M. Baris Okatan, Stephen Jesse, Sergei V. Kalinin
Advances of the development of a ferroelectric field-effect transistor on Ge(001). ICICDT (2017)
Nebojsa D. Jankovic, Chadwin D. Young
Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in Double-Gate FinFETs. Microelectron. Reliab. 59 (2016)
Mohamed T. Ghoneim, Jhonathan P. Rojas, Chadwin D. Young, Gennadi Bersuker, Muhammad Mustafa Hussain
Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon. IEEE Trans. Reliab. 64 (2) (2015)
N. A. Chowdhury, X. Wang, Gennadi Bersuker, Chadwin D. Young, N. Rahim, Durga Misra
n-channel MOS devices in inversion. Microelectron. Reliab. 49 (5) (2009)
R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. 48 (11-12) (2008)
Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker
Electrical characterization and analysis techniques for the high-kappa era. Microelectron. Reliab. 47 (4-5) (2007)
Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff
gate stacks with time dependent measurements. Microelectron. Reliab. 45 (5-6) (2005)
Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics. Microelectron. Reliab. 44 (9-11) (2004)