Byoung Hun Lee

Publication Activity (10 Years)

Years Active: 2004-2021
Publications (10 Years): 4

Top Topics

Distributed Heterogeneous

Top Venues

IEEE Trans. Ind. Electron.

Publications

Seung-Mo Kim, Thi Mi Hanh Nyugen, Jungwon Oh, Yongsu Lee, Soo Cheol Kang, Ho-In Lee, Cihyun Kim, Surajit Some, Hyeon Jun Hwang, Byoung Hun Lee
Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration. IRPS (2021)
Kiyung Kim, Sunmean Kim, Yongsu Lee, Daeyeon Kim, So-Young Kim, Seokhyeong Kang, Byoung Hun Lee
Extreme Low Power Technology using Ternary Arithmetic Logic Circuits via Drastic Interconnect Length Reduction. ISMVL (2020)
So-Young Kim, Sunwoo Heo, Kiyung Kim, Myungwoo Son, Seung-Mo Kim, Ho-In Lee, Yongsu Lee, Hyeon Jun Hwang, Moon-Ho, Byoung Hun Lee
Demonstration of ternary devices and circuits using dual channel graphene barristors. ISMVL (2019)
Sunwoo Heo, Jinwoo Noh, Yun Ji Kim, So-Young Kim, Abdul Karim Khan, Byoung Hun Lee
Design of Ratioless Ternary Inverter Using Graphene Barristor. ISMVL (2016)
Byungjin Cho, Jongwon Yoon, Sung Kwan Lim, Ah Ra Kim, Sun-Young Choi, Dong-Ho Kim, Kyu-Hwan Lee, Byoung Hun Lee, Heung Cho Ko, Myung Gwan Hahm
Metal Decoration Effects on the Gas-Sensing Properties of 2D Hybrid-Structures on Flexible Substrates. Sensors 15 (10) (2015)
Myonglae Chu, Byoungho Kim, Sangsu Park, Hyunsang Hwang, Moongu Jeon, Byoung Hun Lee, Byung-Geun Lee
Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron. IEEE Trans. Ind. Electron. 62 (4) (2015)
Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker
Electrical characterization and analysis techniques for the high-kappa era. Microelectron. Reliab. 47 (4-5) (2007)
Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff
gate stacks with time dependent measurements. Microelectron. Reliab. 45 (5-6) (2005)
Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics. Microelectron. Reliab. 44 (9-11) (2004)