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Byoungho Kim
ORCID
Publication Activity (10 Years)
Years Active: 2006-2020
Publications (10 Years): 6
Top Topics
Image Sensor
Vlsi Circuits
Low Power
Embedded Systems
Top Venues
IEEE Trans. Circuits Syst. II Express Briefs
IEEE Trans. Ind. Electron.
IEEE Trans. Very Large Scale Integr. Syst.
IEEE Access
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Publications
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Byoungho Kim
,
Jacob A. Abraham
Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters.
IEEE Access
8 (2020)
Byoungho Kim
,
Jacob A. Abraham
Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications.
IEEE Trans. Ind. Electron.
66 (1) (2019)
Ilseop Lee
,
Byoungho Kim
,
Byung-Geun Lee
A Low-Power Incremental Delta-Sigma ADC for CMOS Image Sensors.
IEEE Trans. Circuits Syst. II Express Briefs
(4) (2016)
Byoungho Kim
Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications.
IEEE Trans. Circuits Syst. II Express Briefs
(2) (2016)
Myonglae Chu
,
Byoungho Kim
,
Sangsu Park
,
Hyunsang Hwang
,
Moongu Jeon
,
Byoung Hun Lee
,
Byung-Geun Lee
Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron.
IEEE Trans. Ind. Electron.
62 (4) (2015)
Myonglae Chu
,
Byoungho Kim
,
Byung-Geun Lee
A 10-bit 200-MS/s Zero-Crossing-Based Pipeline ADC in 0.13-µm CMOS Technology.
IEEE Trans. Very Large Scale Integr. Syst.
23 (11) (2015)
Byoungho Kim
,
Jacob A. Abraham
Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits.
IEEE Trans. Circuits Syst. II Express Briefs
(10) (2014)
Byoungho Kim
,
Jacob A. Abraham
Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits.
IEEE Trans. Circuits Syst. II Express Briefs
(5) (2014)
Byoungho Kim
,
Jacob A. Abraham
Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems.
IEEE Trans. Circuits Syst. II Express Briefs
(5) (2013)
Byoungho Kim
,
Jacob A. Abraham
Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems.
IEEE Trans. Circuits Syst. II Express Briefs
(11) (2012)
Byoungho Kim
,
Jacob A. Abraham
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap.
(8) (2011)
Byoungho Kim
,
Jacob A. Abraham
Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications.
IEEE Trans. Instrum. Meas.
60 (6) (2011)
Byoungho Kim
,
Nash Khouzam
,
Jacob A. Abraham
Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.
VTS
(2008)
Byoungho Kim
,
Hongjoong Shin
,
Ji Hwan (Paul) Chun
,
Jacob A. Abraham
Predicting mixed-signal dynamic performance using optimised signature-based alternate test.
IET Comput. Digit. Tech.
1 (3) (2007)
Byoungho Kim
,
Zhenhai Fu
,
Jacob A. Abraham
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications.
VTS
(2007)
Byoungho Kim
,
Hongjoong Shin
,
Ji Hwan (Paul) Chun
,
Jacob A. Abraham
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters.
ETS
(2006)
Hongjoong Shin
,
Byoungho Kim
,
Jacob A. Abraham
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
VTS
(2006)