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Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits.

Byoungho KimJacob A. Abraham
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2011)
Keyphrases
  • mixed signal
  • vlsi circuits
  • low power
  • multi channel
  • high speed
  • embedded systems
  • real time
  • digital images
  • signal processing