Hongjoong Shin

Publication Activity (10 Years)

Years Active: 2004-2011
Publications (10 Years): 0

Publications

Joonsung Park, Hongjoong Shin, Jacob A. Abraham
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electron. Test. 27 (3) (2011)
Hongjoong Shin, Joonsung Park, Jacob A. Abraham
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electron. Test. 26 (1) (2010)
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
Parallel Loopback Test of Mixed-Signal Circuits. VTS (2008)
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
Predicting mixed-signal dynamic performance using optimised signature-based alternate test. IET Comput. Digit. Tech. 1 (3) (2007)
Joonsung Park, Hongjoong Shin, Jacob A. Abraham
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. ISQED (2007)
Minsik Cho, Hongjoong Shin, David Z. Pan
Fast substrate noise-aware floorplanning with preference directed graph for mixed-signal SOCs. ASP-DAC (2006)
Hongjoong Shin, Jiseon Park, Jacob A. Abraham
A Statistical Digital Equalizer for Loopback-based Linearity Test of Data Converters. ATS (2006)
Hongjoong Shin, Joonsung Park, Jacob A. Abraham
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. ITC (2006)
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. ETS (2006)
Hongjoong Shin, Byoungho Kim, Jacob A. Abraham
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. VTS (2006)
Hongjoong Shin, Hak-soo Yu, Jacob A. Abraham
LFSR-based BIST for analog circuits using slope detection. ACM Great Lakes Symposium on VLSI (2004)
Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee
Prediction of Analog Performance Parameters Using Oscillation Based Test. VTS (2004)
Hak-soo Yu, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. ITC (2004)