Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.

Hongjoong Shin Byoungho Kim Jacob A. Abraham

Published in: VTS (2006)

Keyphrases

mixed signal
vlsi circuits
low power
multi channel
prediction accuracy
digital circuits
cmos technology
embedded systems
linear prediction
asynchronous circuits
low cost
prediction model
power consumption
high speed
space time
high resolution
built in self test