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Parallel Loopback Test of Mixed-Signal Circuits.

Joonsung ParkHongjoong ShinJacob A. Abraham
Published in: VTS (2008)
Keyphrases
  • mixed signal
  • vlsi circuits
  • low power
  • multi channel
  • low cost
  • digital circuits
  • high speed
  • cmos technology
  • real time
  • power consumption
  • object oriented
  • multi view
  • dynamic scenes
  • low voltage