Prediction of Analog Performance Parameters Using Oscillation Based Test.
Ashwin RaghunathanHongjoong ShinJacob A. AbrahamAbhijit ChatterjeePublished in: VTS (2004)
Keyphrases
- prediction accuracy
- linear regression model
- root mean square error
- parameter values
- maximum likelihood
- parameter estimation
- test data
- sensitivity analysis
- phase space reconstruction
- database
- parameter settings
- prediction model
- regression model
- signal processing
- parameter space
- low cost
- prediction error
- parameter tuning
- bayesian networks
- social networks
- analog vlsi
- genetic algorithm