Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits.
Hongjoong ShinJoonsung ParkJacob A. AbrahamPublished in: J. Electron. Test. (2010)
Keyphrases
- mixed signal
- vlsi circuits
- low power
- multi channel
- prediction accuracy
- prediction model
- high speed
- low cost
- linear prediction
- cmos technology
- digital circuits
- embedded systems
- prediction error
- asynchronous circuits
- power consumption
- computer vision
- built in self test
- low voltage
- bit rate
- optical flow
- pattern recognition