LFSR-based BIST for analog circuits using slope detection.

Hongjoong Shin Hak-soo Yu Jacob A. Abraham

Published in: ACM Great Lakes Symposium on VLSI (2004)

Keyphrases

analog circuits
fault diagnosis
digital circuits
false positives
automatic detection
neural network
object detection
detection algorithm
false alarms
detection rate
real time
computer vision
design methodology