Login / Signup
Electrical characterization and analysis techniques for the high-kappa era.
Chadwin D. Young
Dawei Heh
Arnost Neugroschel
Rino Choi
Byoung Hun Lee
Gennadi Bersuker
Published in:
Microelectron. Reliab. (2007)
Keyphrases
</>
wide range
database
data sets
high precision
automatic analysis
databases
neural network
artificial intelligence
image processing
similarity measure
data structure
natural language
image analysis
statistical analysis