Rino Choi

Publication Activity (10 Years)

Years Active: 2004-2022
Publications (10 Years): 2

Top Topics

Simulated Annealing

Schottky Barrier

Field Effect Transistors

Top Venues

Publications

Rino Choi, Ye-Eun Hong, Anh Duy Nguyen
3-Dimensional Integration with High Interconnection Density. ICICDT (2022)
Manh-Cuong Nguyen, An Hoang-Thuy Nguyen, Jae-Won Choi, Soo-Yeun Han, Jung-Yeon Kim, Rino Choi, Changhwan Choi
Characterization of high pressure hydrogen annealing effect on polysilicon channel field effect transistors using isothermal deep level trap spectroscopy. ICICDT (2016)
R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. 48 (11-12) (2008)
Arnost Neugroschel, Gennadi Bersuker, Rino Choi
Applications of DCIV method to NBTI characterization. Microelectron. Reliab. 47 (9-11) (2007)
Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker
Electrical characterization and analysis techniques for the high-kappa era. Microelectron. Reliab. 47 (4-5) (2007)
Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff
gate stacks with time dependent measurements. Microelectron. Reliab. 45 (5-6) (2005)
Y. H. Kim, Rino Choi, R. Jha, J. H. Lee, Veena Misra, J. C. Lee
Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and Interfacial / High-K Bi-Layer Structure. Microelectron. Reliab. 44 (9-11) (2004)
Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics. Microelectron. Reliab. 44 (9-11) (2004)