Salvatore Lombardo

Publication Activity (10 Years)

Years Active: 2002-2018
Publications (10 Years): 5

Top Topics

Semiconductor Devices

Thermal Conductivity

Environmental Variables

Top Venues

Microelectron. Reliab.

Publications

F. Ricco Galluzzo, A. Scuto, Cosimo Gerardi, A. Battaglia, A. Canino, Salvatore Lombardo
Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions. Microelectron. Reliab. (2018)
Massimo Mazzillo, Domenico Mello, Pietro Paolo Barbarino, Vincenzo Vinciguerra, Giorgio Fallica, Sebania Libertino, Antonella Sciuto, Salvatore Lombardo, Yuri Musienko
Silicon photomultipliers with embedded optical filters for wearable healthcare applications. IEEE SENSORS (2017)
Davide Patti, Salvatore Pennisi, Salvatore Lombardo, Giuseppe Nicotra
Towards a nanofabricated vacuum cold-emitting triode. SMACD (2017)
Antonio Maria Chiarelli, Filippo Zappasodi, Francesco di Pompeo, Arcangelo Merla, Massimo Mazzillo, Giorgio Fallica, Sebania Libertino, Salvatore Lombardo
Flexible CW-fNIRS system based on Silicon Photomultipliers: In-vivo characterization of sensorimotor response. IEEE SENSORS (2017)
Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Microelectron. Reliab. 56 (2016)
Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo
General features of progressive breakdown in gate oxides: A compact model. IRPS (2015)
Maria Francesca Santangelo, S. La Cono, P. Vasquez, Giorgio Fallica, Sabrina Conoci, A. C. Busacca, R. Pagano, Emanuele L. Sciuto, Salvatore Lombardo, Sebania Libertino
CY5 fluorescence measured with silicon photomultipliers. BioCAS (2014)
Salvatore Lombardo, Marisa Ciarlo, Nunzio Casalino
VIRGO: An Innovative Virtual Registry of Underground Infrastructure on Cloud. EMTC (2014)
Nunzio Casalino, Marisa Ciarlo, Salvatore Lombardo
Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures. IDT/IIMSS/STET (2014)
Sebania Libertino, Domenico Corso, G. Murè, A. Marino, Felix Palumbo, Fabio Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, Michael Lisiansky, Yakov Roizin, Salvatore Lombardo
Radiation effects in nitride read-only memories. Microelectron. Reliab. 50 (9-11) (2010)
Sebania Libertino, Venera Aiello, Antonino Scandurra, Marcella Renis, Fulvia Sinatra, Salvatore Lombardo
Feasibility Studies on Si-Based Biosensors. Sensors 9 (5) (2009)
Calogero Pace, Gino Giusi, Felice Crupi, Salvatore Lombardo
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories. IEEE Trans. Instrum. Meas. 57 (2) (2008)
R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. 48 (11-12) (2008)
D. Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. Microelectron. Reliab. 47 (4-5) (2007)
Salvatore Lombardo
Guest Editorial. Microelectron. Reliab. 47 (4-5) (2007)
Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G. Toro, Graziella Malandrino, Ignazio L. Fragalà
by micro- and nano-characterization. Microelectron. Reliab. 47 (4-5) (2007)
Cosimo Gerardi, Salvatore Lombardo, Giuseppe Ammendola, Giovanni Costa, Valentina Ancarani, Domenico Mello, Stella Giuffrida, Maria Cristina Plantamura
Study of nanocrystal memory integration in a Flash-like NOR device. Microelectron. Reliab. 47 (4-5) (2007)
Ester Spitale, D. Corso, Isodiana Crupi, Salvatore Lombardo, Cosimo Gerardi
Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. Microelectron. Reliab. 45 (5-6) (2005)
Felix Palumbo, G. Condorelli, Salvatore Lombardo, Kin Leong Pey, C. H. Tung, L. J. Tang
Structure of the oxide damage under progressive breakdown. Microelectron. Reliab. 45 (5-6) (2005)
James H. Stathis, Barry P. Linder, Rosana Rodríguez, Salvatore Lombardo
Reliability of ultra-thin oxides in CMOS circuits. Microelectron. Reliab. 43 (9-11) (2003)
Rosana Rodríguez, James H. Stathis, Barry P. Linder, Steven P. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, Azeez J. Bhavnagarwala, Salvatore Lombardo
Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectron. Reliab. 42 (9-11) (2002)
Salvatore Lombardo, James H. Stathis, Barry P. Linder
Dependence of Post-Breakdown Conduction on Gate Oxide Thickness. Microelectron. Reliab. 42 (9-11) (2002)