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Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks.

Felix PalumboSalvatore LombardoMoshe Eizenberg
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • thermal conductivity
  • random variables
  • field effect transistors
  • high quality
  • probability distribution
  • failure rate
  • multiple input