Moshe Eizenberg

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 3

Top Topics

Thermal Conductivity

Probability Distribution

Top Venues

Microelectron. Reliab.

Publications

Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg
Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. IRPS (2018)
Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Microelectron. Reliab. 56 (2016)
Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo
General features of progressive breakdown in gate oxides: A compact model. IRPS (2015)