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by micro- and nano-characterization.

Patrick FiorenzaRaffaella Lo NigroVito RaineriSalvatore LombardoRoberta G. ToroGraziella MalandrinoIgnazio L. Fragalà
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • nano scale
  • random walk
  • matching algorithm
  • electron microscopy