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by micro- and nano-characterization.
Patrick Fiorenza
Raffaella Lo Nigro
Vito Raineri
Salvatore Lombardo
Roberta G. Toro
Graziella Malandrino
Ignazio L. Fragalà
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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nano scale
random walk
matching algorithm
electron microscopy