Patrick Fiorenza

Publication Activity (10 Years)

Years Active: 2007-2023
Publications (10 Years): 6

Top Topics

Latest Developments

Thresholding Method

Electrical Properties

Top Venues

Publications

Patrick Fiorenza, Francesco Cordiano, Mario Santo Alessandrino, Alfio Russo, Edoardo Zanetti, Mario Saggio, C. Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs. IRPS (2023)
Beatrice Carbone, Mario Santo Alessandrino, Alfio Russo, Elisa Vitanza, Filippo Giannazzo, Patrick Fiorenza, Fabrizio Roccaforte
Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability. IRPS (2023)
Patrick Fiorenza, C. Bongiorno, A. Messina, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte
SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage instability in power MOSFETs. IRPS (2022)
Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. IRPS (2022)
Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, S. Cascino, A. Messina, Vincenzo Vinciguerra, Michele Calabretta, Alessandro Chini
Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs. IRPS (2022)
Patrick Fiorenza, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, Clarice Di Martino, Alfio Russo, Mario Saggio, Carlo Venuto, Elisa Vitanza, Edoardo Zanetti, Filippo Giannazzo, Fabrizio Roccaforte
Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects. IRPS (2021)
Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Salvatore Lombardo, Roberta G. Toro, Graziella Malandrino, Ignazio L. Fragalà
by micro- and nano-characterization. Microelectron. Reliab. 47 (4-5) (2007)