Login / Signup

Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs.

Marcello CioniPatrick FiorenzaFabrizio RoccaforteMario SaggioS. CascinoA. MessinaVincenzo VinciguerraMichele CalabrettaAlessandro Chini
Published in: IRPS (2022)
Keyphrases
  • identification rate
  • real world
  • user interface
  • initial state
  • high end
  • neural network
  • evolutionary algorithm
  • image quality
  • user friendly
  • low power
  • state transition
  • novice users
  • friendly interface