Login / Signup

Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability.

Beatrice CarboneMario Santo AlessandrinoAlfio RussoElisa VitanzaFilippo GiannazzoPatrick FiorenzaFabrizio Roccaforte
Published in: IRPS (2023)
Keyphrases
  • medical images
  • failure rate
  • real time
  • data mining
  • information retrieval
  • decision making
  • objective function
  • artificial neural networks
  • defect detection
  • room temperature