C. H. Tung

Publication Activity (10 Years)

Years Active: 2002-2021
Publications (10 Years): 1

Top Topics

Solution Quality

Top Venues

Publications

C. J. Wu, S. T. Hsiao, J. Y. Wang, W. H. Lin, C. W. Chang, T. L. Shao, C. H. Tung, Doug C. H. Yu
Ultra High Power Cooling Solution for 3D-ICs. VLSI Circuits (2021)
W. S. Lau, P. W. Qian, Taejoon Han, Nathan P. Sandler, S. T. Che, S. E. Ang, C. H. Tung, T. T. Sheng
and bare Si below 1000degreeC and temperature for minimum low-K interfacial oxide for high-K dielectric on Si. Microelectron. Reliab. 47 (2-3) (2007)
Felix Palumbo, G. Condorelli, Salvatore Lombardo, Kin Leong Pey, C. H. Tung, L. J. Tang
Structure of the oxide damage under progressive breakdown. Microelectron. Reliab. 45 (5-6) (2005)
Kin Leong Pey, C. H. Tung, M. K. Radhakrishnan, L. J. Tang, Y. Sun, X. D. Wang, W. H. Lin
Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM. Microelectron. Reliab. 43 (9-11) (2003)
M. K. Radhakrishnan, Kin Leong Pey, C. H. Tung, W. H. Lin
Physical analysis of hard and soft breakdown failures in ultrathin gate oxides. Microelectron. Reliab. 42 (4-5) (2002)