M. K. Radhakrishnan

Publication Activity (10 Years)

Years Active: 2002-2004
Publications (10 Years): 0

Publications

M. K. Radhakrishnan
Device Reliability and Failure Mechanisms Related to Gate Dielectrics and Interconnects. VLSI Design (2004)
Kin Leong Pey, C. H. Tung, M. K. Radhakrishnan, L. J. Tang, Y. Sun, X. D. Wang, W. H. Lin
Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM. Microelectron. Reliab. 43 (9-11) (2003)
Natarajan Mahadeva Iyer, M. K. Radhakrishnan
ESD Reliability Challenges for RF/Mixed Signal Design & Processing. VLSI Design (2003)
M. K. Radhakrishnan, Kin Leong Pey, C. H. Tung, W. H. Lin
Physical analysis of hard and soft breakdown failures in ultrathin gate oxides. Microelectron. Reliab. 42 (4-5) (2002)