ULTRA HIGH
Experts
- Essa Yacoub
- Kamil Ugurbil
- Robert Turner
- Jörg Felder
- Wietske van der Zwaag
- N. Jon Shah
- Noam Harel
- Yi Wang
- Jian Wang
- Mingzhe Rong
- Benedikt A. Poser
- Tao Wang
- Peter M. Lilleboe
- Calvin C. Teague
- Saverio Giallorenzo
- Yutaka Miyamoto
- Viktor Gruev
- Federico De Martino
- Rainer Goebel
- Lawrence L. Wald
- Shovasis Kumar Biswas
- Donald E. Barrick
- Seyed Javad Azhari
- Stefano Pio Zingaro
- Timothy York
- Andreas Schäfer
- Larisa Safina
- Jan Zimmermann
- Markus Barth
- Francesco Mondada
- Takayuki Kobayashi
- Kâmil Uludag
- Fabrizio Montesi
- Elia Formisano
- Chengcheng Gui
- Seiji Aoyagi
- Lay Jain
- Xiaochun Cao
- Weiwei Wang
Venues
- NeuroImage
- IEEE Access
- Sensors
- CoRR
- IGARSS
- OFC
- ISCAS
- Proc. IEEE
- ICTON
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Ind. Electron.
- Microelectron. J.
- Symmetry
- Remote. Sens.
- RFID-TA
- IEEE Trans. Circuits Syst. II Express Briefs
- SIAM J. Math. Anal.
- IEEE Trans. Commun.
- Entropy
- IAS
- IECON
- IEEE SENSORS
- EMBC
- NEMS
- IEEE Trans. Veh. Technol.
- IEICE Electron. Express
- IEICE Trans. Electron.
- PIMRC
- IEEE J. Solid State Circuits
- DRC
- ICC
- MILCOM
- IEICE Trans. Commun.
- IEEE Trans. Broadcast.
- ECOC
- Appl. Math. Lett.
- ICRA
- Microelectron. Reliab.
- IEEE Trans. Geosci. Remote. Sens.
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