ULTRA HIGH
Experts
- Essa Yacoub
- Kamil Ugurbil
- Noam Harel
- Jörg Felder
- Robert Turner
- N. Jon Shah
- Wietske van der Zwaag
- Federico De Martino
- Fabrizio Montesi
- Kâmil Uludag
- Lawrence L. Wald
- Francesco Mondada
- Seyed Javad Azhari
- Calvin C. Teague
- Benedikt A. Poser
- Takayuki Kobayashi
- Jan Zimmermann
- Jian Wang
- Peter M. Lilleboe
- Mingzhe Rong
- Andreas Schäfer
- Saverio Giallorenzo
- Larisa Safina
- Rainer Goebel
- Stefano Pio Zingaro
- Markus Barth
- Elia Formisano
- Tao Wang
- Viktor Gruev
- Donald E. Barrick
- Timothy York
- Yutaka Miyamoto
- Yi Wang
- Shovasis Kumar Biswas
- Dana Porrat
- Antonio Borgia
- Takashi Ito
- Koji Kotani
- Philippe Rigaux
Venues
- NeuroImage
- IEEE Access
- Sensors
- CoRR
- IGARSS
- OFC
- ISCAS
- Proc. IEEE
- ICTON
- IEEE Trans. Ind. Electron.
- IEEE Trans. Instrum. Meas.
- Microelectron. J.
- Symmetry
- Remote. Sens.
- RFID-TA
- IEEE Trans. Circuits Syst. II Express Briefs
- SIAM J. Math. Anal.
- IAS
- IEEE SENSORS
- IEEE Trans. Commun.
- NEMS
- IECON
- PIMRC
- IEICE Electron. Express
- EMBC
- Entropy
- IEICE Trans. Electron.
- IEEE Trans. Veh. Technol.
- IEEE Trans. Broadcast.
- ICC
- DRC
- ECOC
- Microelectron. Reliab.
- Appl. Math. Lett.
- IEICE Trans. Commun.
- IEEE J. Solid State Circuits
- MILCOM
- ICRA
- J. Comput. Phys.
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