Reliability of ultra-thin oxides in CMOS circuits.
James H. StathisBarry P. LinderRosana RodríguezSalvatore LombardoPublished in: Microelectron. Reliab. (2003)
Keyphrases
- high speed
- delay insensitive
- analog vlsi
- circuit design
- low power
- vlsi circuits
- cmos technology
- focal plane
- floating gate
- chip design
- gate dielectrics
- field effect transistors
- real time
- reliability analysis
- asynchronous circuits
- power dissipation
- analog circuits
- digital circuits
- logic synthesis
- power consumption
- shift register
- mixed signal
- low cost
- computer vision
- genetic algorithm