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Analysis of the effect of the gate oxide breakdown on SRAM stability.

Rosana RodríguezJames H. StathisBarry P. LinderSteven P. KowalczykChing-Te ChuangRajiv V. JoshiGregory A. NorthropKerry BernsteinAzeez J. BhavnagarwalaSalvatore Lombardo
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • leakage current
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