Radiation effects in nitride read-only memories.

Sebania Libertino Domenico Corso G. Murè A. Marino Felix Palumbo Fabio Principato G. Cannella T. Schillaci S. Giarusso F. Celi Michael Lisiansky Yakov Roizin Salvatore Lombardo

Published in: Microelectron. Reliab. (2010)

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