Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories.
Calogero PaceGino GiusiFelice CrupiSalvatore LombardoPublished in: IEEE Trans. Instrum. Meas. (2008)
Keyphrases
- pattern classification
- classification accuracy
- classification systems
- decision trees
- pattern recognition
- object detection
- automatic classification
- text classification
- false positives
- supervised learning
- support vector machine
- decision rules
- support vector
- classification models
- classification algorithm
- classification rate
- image classification
- detection algorithm
- machine learning
- robust detection
- feature vectors
- feature space
- digital mammograms
- feature extraction
- microcalcification clusters
- model selection
- support vector machine classifier
- classification scheme
- false alarms
- associative memory
- benchmark datasets
- markov chain
- knn
- preprocessing
- feature selection