S. Aurite

Publication Activity (10 Years)

Years Active: 2007-2007
Publications (10 Years): 0

Publications

D. Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage. Microelectron. Reliab. 47 (4-5) (2007)