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Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics.

Gennadi BersukerJang H. SimChadwin D. YoungRino ChoiPeter ZeitzoffGeorge A. BrownByoung Hun LeeRobert W. Murto
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • reliability assessment
  • bp neural network model
  • power system
  • wide range
  • similarity measure
  • defect detection
  • database
  • genetic algorithm
  • data structure
  • high precision