Jang H. Sim

Publication Activity (10 Years)

Years Active: 2004-2005
Publications (10 Years): 0

Publications

Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff
gate stacks with time dependent measurements. Microelectron. Reliab. 45 (5-6) (2005)
Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto
Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics. Microelectron. Reliab. 44 (9-11) (2004)