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gate stacks with time dependent measurements.

Chadwin D. YoungGennadi BersukerYuegang ZhaoJeff J. PetersonJoel BarnettGeorge A. BrownJang H. SimRino ChoiByoung Hun LeePeter Zeitzoff
Published in: Microelectron. Reliab. (2005)
Keyphrases
  • measurement noise
  • sensor data
  • travel time
  • sensor measurements
  • nano scale