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Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon.

Mohamed T. GhoneimJhonathan P. RojasChadwin D. YoungGennadi BersukerMuhammad Mustafa Hussain
Published in: IEEE Trans. Reliab. (2015)
Keyphrases
  • metal oxide semiconductor
  • high temperature
  • low cost
  • production system
  • integrated circuit
  • field effect transistors
  • transmission electron microscopy